An approach for prognosis of manufacturing of comparator with account missmatch-induced stress. On increasing of density of elements

Journal Knowledge Industrial Engineering (JKIE)

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Title An approach for prognosis of manufacturing of comparator with account missmatch-induced stress. On increasing of density of elements
 
Creator Pankratov, Evgeny L.
 
Subject Low-power dynamic comparator
Optimization of manufacturing
Analytical approach for modelling
 
Description In this paper we introduce an approach to increase density of field-effect transistors framework low-power dynamic comparator used in the far-end and near-end crosstalk adaptation loop. Based on this approach one shall manufacture a heterostructure with specific sections in epitaxial layer. These sections should be doped by diffusion or ion implantation. Doping procedure finishing by optimized annealing. During analysis of manufacturing of the considered comparator we find an approach for decreasing mismatch-induced stress. Also we consider an approach for analytical modeling of heat and mass transport during manufacturing of the considered comparator and other integrated circuits.
 
Publisher Department of Industrial Engineering - Universitas Yudharta Pasuruan
 
Date 2021-04-29
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
 
Identifier http://jurnal.yudharta.ac.id/v2/index.php/jkie/article/view/2482
 
Source 2541-4461
2460-0113
 
Language en
 
Rights Copyright (c) 2021 Evgeny L. Pankratov
https://creativecommons.org/licenses/by-sa/4.0
 

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