3D from 2D for Nano images using image’s processing methods

INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY

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Field Value
 
Title 3D from 2D for Nano images using image’s processing methods
 
Creator abousalem, zib ziab
 
Subject image processing; Nanomaterials; converting data; Steepest descent method (SDA).
 
Description The scanning electron microscope (SEM) remains a main tool for semiconductor and polymer physics but TEM and AFM are increasingly used for minimum size features which called nanomaterials. In addition some physical properties such as microhardness, grain boundaries and domain structure are observed from optical and polarizing microscope which gives poor information and consequentially the error probability of discussion will be high. Thus it is natural to squeeze out every possible bit of resolution in the SEM, optical and polarizing microscopes for the materials under test. In our paper we will tackling t[1]his problem using different image processing techniques to get more clarify and sufficient information. In the suggested paper we will obtain set of images for prepared samples under different conditions and with different physical properties. These images will be analyzed using the above mentioned technique which starting by converting the prepared sample’s images (gray scale or colored images) to data file (*.dat) in two dimensional using programming. The 2D data will convert to 3D data file using FORTRAN programming. All images will subject to the generate filter algorithm for 3D data file. After filtering the 3D data file we can establish histogram, contours and 3D surface to analysis the image. Another technique will be prepared using Visual FORTRAN for steepest descent algorithm (SDA) which gives the vector map for the obtained data. Finally the depth from one single still image will be created and determine using OpenGL library under Visual C++ language, as well as, perform texture mapping.The quality of filtering depends on the way the data is incorporated into the model. Data should be treated carefully. From our paper we can analysis any part from any image without reanalysis the image, all size of the image as in this paper we take three samples with different size (256 * 256), (400 * 400), (510 * 510), this method decrees the cost of hardware and sample.  
 
Publisher CIRWORLD
 
Date 2015-02-28
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Peer-reviewed Article
Steepest descent algorithm ( SDA)
 
Format application/pdf
 
Identifier http://cirworld.com/index.php/ijct/article/view/2064
 
Source INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY; Vol 14 No 2; 5437-5447
2277-3061
 
Language eng
 
Relation http://cirworld.com/index.php/ijct/article/view/2064/2015
 
Rights Copyright (c) 2016 INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY
http://creativecommons.org/licenses/by/4.0
 

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