Nano-Scale Movement Induced In Graphene Ripples by Multi-Probe Microscopy

International Journal of Advanced Research in Engineering

View Publication Info
 
 
Field Value
 
Title Nano-Scale Movement Induced In Graphene Ripples by Multi-Probe Microscopy
 
Creator Alyobi, Mona
Barnett, Chris
Cobley, Richard
 
Description Abstract— An Omicron low temperature multi-probe technique is used for manipulation of mechanically exfoliated suspended and attached graphene sheets on SiO2 substrates. Scanning electron microscopy (SEM) and Raman spectroscopy are used to detect the graphene sheets and determine their thicknesses and quality, respectively. The interaction of the etched tungsten tip with the graphene is used to lift and release the sheet and induce artificial ripples. Both suspended and attached sheets onto the substrates show different behaviour in response to bias voltage.
IndexTerms: graphene,multi-probe microscopy, ripples.
 
 
Publisher Research Plus Journals
 
Date 2017-06-24
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Peer-reviwed Article
 
Format application/pdf
application/pdf
 
Identifier http://researchplusjournals.com/index.php/IJARE/article/view/278
10.24178/ijare.2017.3.2.22
 
Source International Journal of Advanced Research in Engineering; Vol 3 No 2 (2017): International Journal of Advanced Research in Engineering; 22-25
2412-4362
 
Language eng
 
Relation http://researchplusjournals.com/index.php/IJARE/article/view/278/520
http://researchplusjournals.com/index.php/IJARE/article/view/278/521
 
Rights Copyright (c) 2017 International Journal of Advanced Research in Engineering (ISSN Online: 2412-4362)
http://creativecommons.org/licenses/by-sa/4.0
 

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