Highly textured and transparent RF sputtered Eu2O3 doped ZnO films

Nano Reviews & Experiments

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Title Highly textured and transparent RF sputtered Eu2O3 doped ZnO films
Creator Sreeja Sreedharan, Remadevi
Ganesan, Vedachalaiyer
Pillai Sudarsanakumar, Chellappan
Bhavsar, Kaushalkumar
Prabhu, Radhakrishna
Pillai, Vellara Pappukutty Pillai Mahadevan; Department of Optoelectronics, University of Kerala, Kariavattom, Thiruvananthapuram, Kerala 695581, India.
Subject visible photoluminescence; dielectric constants; micro-Raman spectra; optical constants; residual stress
Description Background: Zinc oxide (ZnO) is a wide, direct band gap II-VI oxide semiconductor. ZnO has large exciton binding energy at room temperature, and it is a good host material for obtaining visible and infrared emission of various rare-earth ions.Methods: Europium oxide (Eu2O3) doped ZnO films are prepared on quartz substrate using radio frequency (RF) magnetron sputtering with doping concentrations 0, 0.5, 1, 3 and 5 wt%. The films are annealed in air at a temperature of 773 K for 2 hours. The annealed films are characterized using X-ray diffraction (XRD), micro-Raman spectroscopy, atomic force microscopy, ultraviolet (UV)-visible spectroscopy and photoluminescence (PL) spectroscopy.Results: XRD patterns show that the films are highly c-axis oriented exhibiting hexagonalwurtzite structure of ZnO. Particle size calculations using Debye-Scherrer formula show that average crystalline size is in the range 15–22 nm showing the nanostructured nature of the films. The observation of low- and high-frequency E2 modes in the Raman spectra supports the hexagonal wurtzite structure of ZnO in the films. The surface morphology of the Eu2O3 doped films presents dense distribution of grains. The films show good transparency in the visible region. The band gaps of the films are evaluated using Tauc plot model. Optical constants such as refractive index, dielectric constant, loss factor, and so on are calculated using the transmittance data. The PL spectra show both UV and visible emissions.Conclusion: Highly textured, transparent, luminescent Eu2O3 doped ZnO films have been synthesized using RF magnetron sputtering. The good optical and structural properties and intense luminescence in the ultraviolet and visible regions from the films suggest their suitability for optoelectronic applications.Keywords: visible photoluminescence; dielectric constants; micro-Raman spectra; optical constants; residual stress Responsible Editor: Dr Raquel Verdejo, Instituto de Ciencia y Tecnología de Polímeros, CSIC, Madrid, Spain.Citation: Nano Reviews 2015, 6: 26759 - http://dx.doi.org/10.3402/nano.v6.26759
Publisher Co-Action Publishing
Contributor nil
Date 2015-03-11
Type info:eu-repo/semantics/article

Format application/pdf
Identifier http://www.nanoreviewsexperiments.net/index.php/nano/article/view/26759
Source Nano Reviews & Experiments; Vol 6 (2015) incl Supplements
Language eng
Relation http://www.nanoreviewsexperiments.net/index.php/nano/article/view/26759/38909

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