Characteristic Test Of Transistor Based Multisim Software

PROtek : Jurnal Ilmiah Teknik Elektro

View Publication Info
 
 
Field Value
 
Title Characteristic Test Of Transistor Based Multisim Software
 
Creator Djalal, Muhammad Ruswandi
HR, Herman
 
Subject
Keywords : Multisim, Transistor, Input-Output Characteristic, Semiconductor

 
Description Abstract--The purpose of this study is to determine the characteristics of the transistor before it is used in the circuit. Transistors are semiconductor devices used as amplifiers, as circuit breakers and connectors (switching), voltage stabilization, signal modulation or as other functions. Transistor performance can be seen by testing input-output characteristics. Multisim is an electronic capture and schematic simulation program that is part of a series of circuit design programs, together with NI Ultiboard. Multisim can properly simulate electronic components.  
 
Publisher Program Studi Teknik Elektro Universitas Khairun
 
Contributor
 
Date 2019-09-30
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion

 
Format application/pdf
 
Identifier https://ejournal.unkhair.ac.id/index.php/protk/article/view/1214
10.33387/protk.v6i2.1214
 
Source PROtek : Jurnal Ilmiah Teknik Elektro; Vol 6, No 2 (2019): PROtek Vol 6, No. 2; 63 - 67
PROtek : Jurnal Ilmiah Teknik Elektro; Vol 6, No 2 (2019): PROtek Vol 6, No. 2; 63 - 67
2527-9572
2354-8924
10.33387/protk.v6i2
 
Language ind
 
Relation https://ejournal.unkhair.ac.id/index.php/protk/article/view/1214/pdf
 
Rights ##submission.copyrightStatement##
 

Contact Us

The PKP Index is an initiative of the Public Knowledge Project.

For PKP Publishing Services please use the PKP|PS contact form.

For support with PKP software we encourage users to consult our wiki for documentation and search our support forums.

For any other correspondence feel free to contact us using the PKP contact form.

Find Us

Twitter

Copyright © 2015-2018 Simon Fraser University Library