Method and Apparatus for a Differential Localized Microscopy System Based on Position Sensitive Detector

International Journal of Research and Engineering

View Publication Info
 
 
Field Value
 
Title Method and Apparatus for a Differential Localized Microscopy System Based on Position Sensitive Detector
 
Creator Dijkkomp, Venky
Ogale, Kanai
 
Description A precise measurement of position using a Position Sensitive Detector (PSD) is fundamental in mitigating the geometric error factors that are caused by the pincushion-type distortion of these sensors. These errors can be addressed by implementing a differential localized method to significantly reduce signal to noise ratio (SNR) in PSD and the microscopy system. The differential method based on Time difference of Arrival (TDoA) is proposed and implemented in this research. The simulation and the actual results of the system further confirm the significant improvement in accuracy and precision of the system.
 
Publisher IJRE Publisher
 
Date 2018-09-05
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Peer-reviewed Article
 
Format application/pdf
 
Identifier https://digital.ijre.org/index.php/int_j_res_eng/article/view/352
10.21276/ijre.2018.5.8.1
 
Source International Journal of Research and Engineering; Vol 5 No 8 (2018): August 2018 Edition; 470-474
2348-7860
2348-7852
 
Language eng
 
Relation https://digital.ijre.org/index.php/int_j_res_eng/article/view/352/319
 
Rights Copyright (c) 2018 Venky Dijkkomp, Kanai Ogale
http://creativecommons.org/licenses/by/4.0
 

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